Shanghai XinJian Instrument & Equipment Co.
While doing research on the QT-2 curve tracer, I found some interesting tidbits on the factory that made these test gear (and many more).
Originally founded as the Shanghai No. 21 Radio Factory in 1951 by the Shanghai Municipal Governement, Shanghai XinJian Instrument & Equipment Co. (“SHXJ”), became known nationally with its successful development the GT-1 Tube Characteristic Curve Tracer in June 1960, the tracer was capable of measuring the dynamic parameters of vacuum tubes. Mass production began in 1962. [Never seen one in existence yet…]
In 1962, SHXJ launched the GS-5 Tube Parameter Tester, mass production began in September 1966. The tester made use of different punch card to measure the static parameters of many different types of vacuum tubes, both foreign and domestic made. The measurement error was ± 5%. From 1962 to 1990, a total of 34,292 units were produced. [The GS-5 is a direct copy of the LS3-3.]
The early 1960s, the development of semiconductor parameter measurement was in demand. In 1962, the SHXJ began development of an experimental prototype transistor parameter measurement instrument. In 1963, JZC-1 (630-type) Transistor Tester began its production run. Thereafter, the transistor parameter measurement instrument categories expanded rapidly to form the QC and QG series in the early 1970s. These products can measure the cutoff frequency of the small power transistor, including noise figure, power gain, automatic gain control characteristics, etc., but are also capable of measuring the FET’s transconductance, pinch-off voltage, the drain saturation current, the input capacitance, the feedback capacitance and other parameters. The units are capable of measurement frequency range from the low-frequency, high-frequency, UHF, to the microwave band. The JS-7-type transistor parameter tester sales, with an annual output of 18,507 units, accounting for more than half of the total production the entire semiconductor measuring instrument production.
In 1962, SHXJ began development of a dynamic transistor curve tracer. And in 1963, the JT-1 Transistor Characteristics Curve Tracer was put into production. The instrument was not only able of observing the dynamic responses of the transistor under the different conditions, but was also capable of observing the base source voltage for reliable, quantitative and rapid measurements under dynamic operating conditions. By 1978, SHXJ also introduced higher power transistor curve tracers. These products were popular from the mid-1970s to the 1980’s [and some are still in production today such as the QT-2.]
SHXJ also tried to develop testers for solid-state circuits and CRT color picture tubes. In 1970, it released the 905 Solid State Circuit Analyzer, however, the sales were too small, and only a small batch was produced, the production was discontinued after two years. In 1976, SHXJ did produce a color picture tube tester, but only 7 units were made.
Another important product category for SHXJ was the noise tester noise measurement device with the growing domestic demand from the aerospace, communications, radar, and other industries in the 1970s. The noise measurement of high-frequency transistors placed high demand on the proposed noise the coefficient magnitude unified requirements. 1978, SHXJ launch the XO11 Coaxial Thermal Noise Measurement Standard Device, with output stability of 0.003 db, resolution of 0.01 dB, the noise generator can be precisely and continuously adjustable in 0.003 dB increments, was a high-stability, high sensitivity, high precision, high-resolution instruments that compared favorably to international standard in 1979. Saturation diode noise source development began in 1982 and mass production began in 1984, the Q03 Transistor Noise Standard Generator was used by the national standardization board.
By the end of 1990, SHXJ produced 23 types of measurement instruments, with annual production volume of 1819 units
Prizes and Awards.
1964 – Ministry of Machinery Industry New Product Award , Fourth Prize for the GT-2 Tube Characteristics Curve Tracer [which is the direct copy of the venerable Tektronix 570].
1979 – National Metrology Scientific Research Center, Third Prize – XO11 Coaxial Thermal Noise Measurement Device.
1979 – Ministry of Machinery Industry New Product Award, First Prize for JT-1 Transistor Characteristics Curve Tracer [which is the copy of the Tektronix 575].
1980 – Major Scientific Research by Shanghai Factories Shanghai Government., First Prize.
1983 – Ministry of Electronics Industry, High Quality Product for JS-7B Transistor Parameters Tester.
1988 – Ministry of Machinery Industry National Quality Award, Silver Medal for the the XJ4810 Transistor Characteristics Curve Tracer.
Some classic products made by the company: